BENABDENBI Mounir
Direction de recherche : Meryem MARZOUKI
Conception en vue du test de systèmes intégrés sur silicium (SoC)
Soutenance : 27/09/2002
Membres du jury :
Christian Landrault - rapporteur
Paolo Prinetto - rapporteur
Laroussi Bouzaida
Alain Greiner
Mereym Marzoukli
Un docteur (2007) à Sorbonne Université
- 2007
- TUNA Matthieu : Auto-test logiciel des systèmes intégrés sur Puce (SoC).
Publications 2000-2014
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2014
- S.‑U. Rehman, A. Blanchardon, A. Ben Dhia, M. Benabdenbi, R. Chotin‑Avot, L. Naviner, L. Anghel, H. Mehrez, E. Amouri, Z. Marrakchi : “Impact of Cluster Size on Routability, Testability and Robustness of a Cluster in a Mesh FPGA”, IEEE Computer Society Annual Symposium on VLSI (ISVLSI'14), Tampa, FL, United States, pp. 553-558, (IEEE) (2014)
- Zh. Zhang, D. Refauvelet, A. Greiner, M. Benabdenbi, F. Pêcheux : “On-the-Field Test and Configuration Infrastructure for 2-D-Mesh NoCs in Shared-Memory Many-Core Architectures”, IEEE Transactions on Very Large Scale Integration (VLSI) Systems, vol. 22 (6), pp. 1364-1376, (IEEE) (2014)
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2013
- A. Ben Dhia, S. Ur Rehman, A. Blanchardon, L. Naviner, M. Benabdenbi, R. Chotin‑Avot, H. Mehrez, E. Amouri, Z. Marrakchi : “A Defect-tolerant Cluster in a Mesh SRAM-based FPGA”, International Conference on Field-Programmable Technology (FPT), Kyoto, Japan, pp. 434-437, (IEEE Computer Society) (2013)
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2011
- Zh. Zhang, D. Refauvelet, A. Greiner, M. Benabdenbi, F. Pêcheux : “Localization of Damaged Resources in NoC Based Shared-Memory MP2SOC, using a Distributed Cooperative Configuration Infrastructure”, The 29th IEEE VLSI Test Symposium (VTS), Dana Point, California, United States (2011)
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2010
- E. Faure, M. Benabdenbi, F. Pêcheux : “Distributed online software monitoring of manycore architectures”, 16th IEEE International On-Line Testing Symposium, Corfou Island, Greece, pp. 56-61, (IEEE) (2010)
- Zh. Zhang, A. Greiner, M. Benabdenbi : “Fully Distributed Initialization Procedure for a 2D-Mesh NoC, Including Off Line BIST and Partial Deactivation of Faulty Components”, The 16th IEEE International On-Line Testing Symposium (IOLTS), Corfu, Greece, pp. 194-196 (2010)
- E. Faure, G. Marchesan Almeida, M. Benabdenbi, P. Benoit, F. Clermidy, F. Pêcheux, G. Sassatelli, L. Torres : “An In-Memory Monitoring Database For Self Adaptive MP²SoCs”, IEEE International Conference on Design and Architectures for Signal and Image Processing, Edimbourg, United Kingdom, pp. 97-104 (2010)
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2009
- M. Benabdenbi, F. Pêcheux, E. Faure : “Online test and monitoring of multiprocessor socs : A software-based approach”, LATW’09 : Proceedings of the 10th Latin America Test Workshop, Buzios, Rio de Janeiro, Brazil, pp. 1-6, (IEEE) (2009)
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2007
- M. Tuna, M. Benabdenbi, A. Greiner : “At-Speed Testing of Core-Based System-On-Chip Using an Embedded Micro-Tester”, VTS IEEE VLSI Test Symposium, Berkeley, California, United States, pp. 447-454, (IEEE) (2007)
- M. Tuna, O. Garcia, M. Benabdenbi : “Software-Based Self-Test Strategies for Memory Caches of RISC Processor Cores”, LATW IEEE Latin-American Test Workshop, Cuzco, Peru, pp. 124-130 (2007)
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2006
- A. Greiner, F. Pétrot, M. Carrier, M. Benabdenbi, R. Chotin‑Avot, R. Labayrade : “MP-SoC Architecture for an Obstacle Detection Application in Pre-Crash Situation”, 2nd International Workshop on Reconfigurable Communication-centric Systems-on-Chip (ReCoSoC'06), Montpellier, France, pp. 24-30, (Université Montpellier II) (2006)
- M. Tuna, M. Benabdenbi, A. Greiner : “T-Proc: An Embedded IEEE1500-Wrapped Cores Tester”, PRIME IEEE Conference on Ph.D. Research in MicroElectronics and Electronics, Otranto, Italy, pp. 493-496, (IEEE) (2006)
- M. Tuna, M. Benabdenbi, A. Greiner : “STESOC: A Software-Based Test-Access-Mechanism Controller”, ETS IEEE European Test Symposium, Southampton, United Kingdom, pp. 91-96 (2006)
- M. Tuna, M. Benabdenbi : “Software-Based Self-Test of Register Files in RISC Processor Cores using March Algorithms”, LATW IEEE Latin-American Test Workshop digest of papers, Buenos Aires, Argentina, pp. 67-72 (2006)
- A. Greiner, F. Pétrot, M. Carrier, M. Benabdenbi, R. Chotin‑Avot, R. Labayrade : “Mapping an obstacles detection, stereo vision-based, software application on a multi-processor system-on-chip”, IV 2006 - IEEE Intelligent Vehicles Symposium, Tokyo, Japan, pp. 370-376, (IEEE) (2006)
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2005
- M. Tuna, M. Benabdenbi, A. Greiner : “STESI: a new software-based strategy for testing socs containing wrapped IP cores”, MIXDES 2005 - 12th International conference on Mixed Design of Integrated Circuits and Systems, Krakow, Poland, pp. 459-464 (2005)
- M. Tuna, M. Benabdenbi, A. Greiner : “STESI: Testing wrapped IP cores using a dedicated Test Processor”, I-IP IEEE International Workshop on Infrastructure IP, Palm Springs, California, United States, pp. 60-66 (2005)
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2004
- M. Benabdenbi, A. Greiner, F. Pêcheux, E. Viaud, M. Tuna : “STEPS: experimenting a new software-based strategy for testing SoCs containing P1500-compliant IP cores”, DATE 2004 - Design Automation and Test in Europe Conference, Paris, France, pp. 712-713, (IEEE) (2004)
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2002
- M. Benabdenbi : “Conception en vue du test de systèmes intégrés sur silicium (SoC)”, soutenance de thèse, soutenance 27/09/2002, direction de recherche Marzouki, Meryem (2002)
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2001
- M. Benabdenbi, W. Maroufi, M. Marzouki : “Testing TAPed Cores and Wrapped Cores With The Same Test Access Mechanism”, DATE 2001 - IEEE Design Automation and Test in Europe, Munich, Germany, pp. 150-155, (IEEE) (2001)
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2000
- W. Maroufi, M. Benabdenbi, M. Marzouki : “Solving the I/O Bandwidth Problem in System on a Chip Testing”, XIII Symposium on Integrated Circuits and Systems Design (SBCCI'00), Manaus, Brazil, pp. 9-14, (IEEE) (2000)
- W. Maroufi, M. Benabdenbi, M. Marzouki : “Controlling the CAS-BUS TAM with IEEE 1149.1 TAP: A Solution for Systems-On-a-Chip Testing”, 4th IEEE International Workshop on Testing Embedded Core-based Systems (TECS'00), Montréal, Canada (2000)
- M. Benabdenbi, W. Maroufi, M. Marzouki : “CAS-BUS: A Scalable and Reconfigurable Test Access Mechanism for Systems on a Chip”, Design Automation and Test in Europe Conference (DATE'2000), Paris, France, pp. 141-145, (IEEE) (2000)