S. Baarir, C. Braunstein, E. Encrenaz, J.‑M. Ilié, T. Li, I. Mounier, D. Poitrenaud, S. Younes : “Quantifying Robustness by Symbolic Model checking”, 1st Hardware Verification Workshop (CAV workshop), Edinburgh, United Kingdom, pp. 1-12 (2010)
2009
A. Suelflow, G. Fey, C. Braunstein, U. Kuehne, R. Drechsler : “Increasing the Accuracy of SAT-Based Debugging”, DATE Design Automation and Test in Europe Conference, Nice, France, pp. 1326-1331, (IEEE) (2009)
S. Baarir, C. Braunstein, R. Clavel, E. Encrenaz, J.‑M. Ilié, R. Leveugle, I. Mounier, L. Pierre, D. Poitrenaud : “Complementary formal approaches for dependability analysis”, The 24th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, Chicago, Illinois, United States, pp. 331-339, (IEEE Computer Society) (2009)